Carbon nanostructures grown with electron and ion beam methods
نویسنده
چکیده
We present a comparative study where carbon nanostructures were prepared by electron and ion beam methods. The deposited thin films were analysed by Raman analysis, nanoindentation, Energy dispersive X-ray analysis (EDX) and atomic force microscopy (AFM). In most conditions, the material formed is hydrogenated amorphous carbon. This study was used to form sharp AFM supertip structures which were successfully used to image sintered ceramic samples.
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